{"id":2102,"date":"2026-10-09T08:39:49","date_gmt":"2026-10-08T23:39:49","guid":{"rendered":"http:\/\/127.0.0.1\/?page_id=2102"},"modified":"2026-10-11T01:25:50","modified_gmt":"2026-10-10T16:25:50","slug":"research","status":"publish","type":"page","link":"https:\/\/www.miyamoto-lab.com\/en\/research\/","title":{"rendered":"Research"},"content":{"rendered":"\n

Read images of other worlds. Measure their materials in the laboratory. Use instruments and models to understand the surfaces of the Moon and Martian moons. Our research brings together exploration data, experiments and numerical modelling, from planetary science to the use of space resources.<\/p>\n\n\n\n\n\n

\"Concept
Concept illustration of LDA measurements on the Moon (CG). From the 2026 LDA presentation.<\/figcaption><\/figure>\n\n\n

LDA: an astronaut-deployed instrument for Artemis<\/h2>\n\n\n\n

Artemis aims to return astronauts to the Moon\u2019s surface for the first time since Apollo, more than half a century ago. The Lunar Dielectric Analyzer (LDA) is being developed as a science instrument for astronauts to carry to the Moon and deploy on its surface.<\/strong><\/p>\n\n\n\n

In March 2024, LDA was selected as one of NASA\u2019s first three astronaut-deployed instruments through a global call. Among those three, it is the only one led by an institution outside the United States.<\/strong> Hideaki Miyamoto (PI) leads the University of Tokyo-based international team, working with Makito Kobayashi (Deputy PI) under a direct contract with NASA.<\/p>\n\n\n\n

NASA selection announcement (26 March 2024) \u2197<\/a> \/ University of Tokyo announcement (4 April 2024) \u2197<\/a><\/p>\n\n\n

The Lunar Dielectric Analyzer (LDA) is designed to measure the dielectric properties of lunar regolith, the loose grains and rock fragments covering the surface. Sensors placed against the ground probe how the material responds to electromagnetic fields.<\/p>\n\n\n

Composition, packing density, temperature and ice can all affect dielectric properties. We combine measurements of analog materials with heat-transfer models to distinguish possible explanations for a signal. The observing concept also considers repeated measurements during temperature changes caused by a lander\u2019s moving shadow.<\/p>\n\n\n

\"LDA-related
LDA-related test hardware with regolith simulant. From the May 2026 SX site presentation. \u00a9 The University of Tokyo<\/figcaption><\/figure>\n\n\n

Connecting measurements, experiments and models<\/h3>\n\n\n